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https://hdl.handle.net/2440/54320
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Type: | Conference paper |
Title: | Defect tolerant prefix adder design |
Author: | Moric, R. Phillips, B. Liebelt, M. |
Citation: | Proceedings of the SPIE Smart Materials, Nano-, and Micro-Smart Systems, 2008. Volume 7268, pp. 72680F-9 |
Publisher: | SPIE |
Publisher Place: | CD |
Issue Date: | 2008 |
ISSN: | 0277-786X |
Conference Name: | SPIE Smart Materials, Nano-, and Micro-Smart Systems 2008 (2008 : Melbourne Australia) |
Editor: | Al-Sarawi, S.F. Varadan, V.K. Weste, N. Kalantar-Zadeh, K. |
Statement of Responsibility: | Moric Robert, Phillips Braden J.and Liebelt Michael J. |
Abstract: | This paper introduces a defect tolerant 64-bit Sklansky prefix adder, designed with the goal of increasing its reliability and extending its lifetime in the presence of hard faults. We consider defect tolerance for early transistor wear-out by exploring the design of fine-grained reconfigurable logic. The approach involves enabling spare processing elements to replace defective elements. Power gating techniques are used to disable faulty logic blocks and enable spare logic. Minimum sized transistors are used for spare processing elements to reduce area overhead, and simplify reconfiguration interconnect. The performance of the design is compared to a baseline, non-repairing design using the cost metrics of: area overhead, power consumption, and performance in the fault free and faulty case |
Description: | ©2008 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. |
DOI: | 10.1117/12.814438 |
Published version: | http://dx.doi.org/10.1117/12.814438 |
Appears in Collections: | Aurora harvest Electrical and Electronic Engineering publications Environment Institute publications |
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