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https://hdl.handle.net/2440/81190
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dc.contributor.author | Amri, A. | - |
dc.contributor.author | Jiang, Z. | - |
dc.contributor.author | Bahri, P. | - |
dc.contributor.author | Yin, C. | - |
dc.contributor.author | Zhao, X. | - |
dc.contributor.author | Xie, Z. | - |
dc.contributor.author | Duan, X. | - |
dc.contributor.author | Widjaja, H. | - |
dc.contributor.author | Rahman, M. | - |
dc.contributor.author | Pryor, T. | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | The Journal of Physical Chemistry C: Energy Conversion and Storage, Optical and Electronic Devices, Interfaces, Nanomaterials, and Hard Matter, 2013; 117(32):16457-16467 | - |
dc.identifier.issn | 1932-7447 | - |
dc.identifier.issn | 1932-7455 | - |
dc.identifier.uri | http://hdl.handle.net/2440/81190 | - |
dc.description.abstract | Novel copper-cobalt oxide thin films with different copper/cobalt molar ratios, namely, [Cu]/[Co] = 0.5, 1, and 2, have been successfully coated on aluminum substrates via a simple and cost-effective sol-gel dip-coating method. Coatings were characterized using high resolution synchrotron radiation X-ray photoelectron spectroscopy (SR-XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy, in combination with nanomechanical testing and field emission scanning electron microscopy (FESEM). The surfaces of both [Cu]/[Co] = 0.5 and 1 samples consisted primarily of fine granular nanoparticles, whereas the [Cu]/[Co] = 2 has a smoother surface. The analyses reveal that the increase of copper concentration in the synthesis process tends to promote the formation of octahedral Cu²⁺ which minimizes the development of octahedral Cu⁺, and these octahedral Cu²⁺ ions substitute the Co²⁺ site in cobalt structure host. The local coordinations of Co, Cu and O are not substantially influenced by the change in the copper to cobalt concentration ratios except for the [Cu]/[Co] = 2 coating where the local coordination appears to slightly change due to the loss of octahedral Cu⁺. The present film coatings are expected to exhibit good wear resistance especially for the [Cu]/[Co] = 1.0 sample due to its high hardness/elastic modulus (H/E) ratio. Finite element modeling (FEM) indicated that, under spherical loading conditions, the high stress and the plastic deformation were predominantly concentrated within the coating layer, without spreading into the substrate. | - |
dc.description.statementofresponsibility | Amun Amri, Zhong-Tao Jiang, Parisa A. Bahri, Chun-Yang Yin, Xiaoli Zhao, Zonghan Xie, Xiaofei Duan, Hantarto Widjaja, M. Mahbubur Rahman, and Trevor Pryor | - |
dc.language.iso | en | - |
dc.publisher | American Chemical Society | - |
dc.rights | © 2013 American Chemical Society | - |
dc.source.uri | http://dx.doi.org/10.1021/jp404841m | - |
dc.subject | Copper concentration | - |
dc.subject | Field emission scanning electron microscopy | - |
dc.subject | Mechanical characteristics | - |
dc.subject | Nanomechanical testing | - |
dc.subject | Near-edge X-ray absorption fine structure spectroscopies | - |
dc.subject | Sol-gel dip-coating method | - |
dc.subject | Surface electronic structures | - |
dc.subject | Synchrotron radiation x-rays | - |
dc.title | Surface electronic structure and mechanical characteristics of copper-cobalt oxide thin film coatings: soft X-ray synchrotron radiation spectroscopic analyses and modeling | - |
dc.type | Journal article | - |
dc.identifier.doi | 10.1021/jp404841m | - |
pubs.publication-status | Published | - |
Appears in Collections: | Aurora harvest 4 Mechanical Engineering publications |
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